skip to content

ICSA Co-Sponsored Publications

Statistics and Its Interface is an international statistical journal promoting the interface between statistics and other disciplines including, but not limited to, biomedical sciences, geosciences, computer sciences, engineering, and social and behavioral sciences. The journal publishes high-quality articles in broad areas of statistical science, emphasizing substantive problems, sound statistical models and methods, clear and efficient computational algorithms, and insightful discussions of the motivating problems. Visit SII's web page at http://www.intlpress.com/SII/SII-BrowseJournal.php for more information.

 

Special Issue on Modern Bayesian Statistics

Statistics and Its Interface (SII) invites submissions for a special issue on Modern Bayesian Statistics. Research in Bayesian statistics is rapidly expanding and diversifying, making it increasingly popular and widely used in many fields including medicine, biology, public health, epidemiology, engineering, finance, economics, environmental sciences, and social sciences. SII promotes interface between statistical theory and methodology and applications. Thus, we strongly encourage substantive applications of Bayesian statistical theory and methodology in all areas of sciences. Your papers, once accepted, will be published together in a future issue of SII.

The submission deadline for this special issue is November 1, 2013. All submissions must be online through the website
http://www.e-publications.org/ip/sbs/index.php/index/login
and please state that your submissions are “For the Special Issue on Modern Bayesian Statistics” in the Box of Comments to the editors.  The submissions will go through regular review process. As the editors for this special issue, we will handle the peer review timely and carefully.

With your support and collaboration, we are confident that the special issue will be a success that will reflect the state-of-art of research at the frontier of this vital and rapidly developing area. We look forward to receiving your papers in due course.

Ming-Hui Chen (Guest Editor), University of Connecticut
Heping Zhang (Editor-in-Chief), Yale University